An Investigation of the Accuracy of Diffraction Stress Evaluation of Textured Materials
نویسندگان
چکیده
The determination of residual or applied stress through X-ray or neutron diffraction is generally regarded as a mature method. Most x-ray diffractometers can be used to perform a measurement of lattice strain vs. tilt angle, which is then converted into stress. The apparent simplicity of the conversion (the sinø law comes to mind) betrays the fact that elastic and plastic anisotropy often cause aberrations of varying magnitude. This investigation focuses on the role of the diffraction elastic constants, the methods of their calculation in the presence of preferred orientation, and the accuracy at which stresses can be determined in the presence of preferred orientation.
منابع مشابه
X-RAY STRESS ANALYSIS IN PRESENCE OF GRADIENTS AND TEXTURE, Ch. Genzel, pp. 247-256
In comparison with most of the 'non-diffraction methods' for residual stress analysis X-ray stress analysis (XSA) of polycrystalline materials is very time-consuming with respect to both, measurement and evaluation. This especially applies to materials with strong texture and/or steep residual stress gradients in the near surface region, the investigation of which is an important topic in moder...
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